Origins of debris and mitigation through a secondary RF plasma system for discharge-produced EUV sources
نویسندگان
چکیده
RF plasma based mitigation has been studied as an improved debris mitigation scheme for extreme ultraviolet (EUV) sources. The RF plasma ionizes sputtered neutral debris and, when used in conjunction with a collimator (also known as a foil trap), inhibits that debris from reaching the collector optics. An ionization fraction of 61 ± 3% has been measured. In addition, increased scattering of the ion component of the debris has led to a decrease in erosive flux reaching the diagnostics. Results from in situ high-precision quartz crystal oscillators, ex situ surface characterization (Auger, XPS), and secondary plasma characterization is presented for a series of mitigation schemes, including a foil trap in conjunction with the RF plasma. 2004 Elsevier B.V. All rights reserved.
منابع مشابه
Illinois debris - mitigation EUV applications laboratory
Gaseous discharge light sources are leading candidates for generating 13.5 nm wavelengths needed for next-generation optical lithography. Electrode debris reaching the first collector optic is a serious concern for device lifetime and cost of ownership. This paper describes the experimental setup and initial data obtained for testing secondary-plasmabased debris mitigation for EUV gas discharge...
متن کاملDebris-free Euv Source for At-wavelength Metrology
Parallel to the development and optimization of high-power EUV sources for lithography, the realization of low-cost EUV sources for at-wavelength metrology is strongly required. These sources are important tools for the characterization of EUV mirrors and masks, for the determination of thin film transmission (EUV filters), for research on resist materials, and for the calibration of EUV detect...
متن کاملMultidimensional Simulation and Optimization of Hybrid Laser and Discharge Plasma Devices for EUV Lithography
Current devices for EUV lithography combine both laser and discharge physics to achieve sufficient brightness with minimum debris generation to support the throughput requirements of High-Volume Manufacturing (HVM) lithography exposure tools with long lifetime. Source performance, Debris mitigation, and reflector system are critical to efficient EUV collection and component lifetime. Integrated...
متن کاملEffects of Plasma Spatial Profile on Conversion Efficiency of Laser Produced Plasma Sources for EUV Lithography
Extreme ultraviolet (EUV) lithography devices that use laser produced plasma (LPP), discharge produced plasma (DPP), and hybrid devices need to be optimized to achieve sufficient brightness with minimum debris generation to support the throughput requirements of High-Volume Manufacturing (HVM) lithography exposure tools with long lifetime. Source performance, debris mitigation, and reflector sy...
متن کاملExperimental test chamber design for optics exposure testing and debris characterization of a xenon discharge produced plasma source for extreme ultraviolet lithography
A commercial EUV light source is currently used in the MS-13 EUV Micro Exposure Tool (MET) produced by Exitech Ltd. The source uses a xenon z-pinch discharge to produce 13.5 nm light intended for use in extreme ultraviolet lithography (EUVL). During operation, an erosive flux of particles is ejected from the pinch plasma, contributing to limitations in the lifetime of nearby collector optics. A...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
دوره شماره
صفحات -
تاریخ انتشار 2004